Study of the Resistive Switching Effect in Chromium Oxide Thin Films by Use of Conductive Atomic Force Microscopy
Crossref DOI link: https://doi.org/10.1007/s11664-015-3889-z
Published Online: 2015-06-20
Published Print: 2015-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Pham, Kim Ngoc
Choi, Minsu
Tran, Cao Vinh
Do Nguyen, Trung
Van Hieu Le,
Choi, Taekjib
Lee, Jaichan
Phan, Bach Thang
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