Consistency of ZT-Scanner for Thermoelectric Measurements from 300 K to 700 K: A Comparative Analysis Using Si80Ge20 Polycrystalline Alloys
Crossref DOI link: https://doi.org/10.1007/s11664-015-4101-1
Published Online: 2015-10-15
Published Print: 2016-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Vasilevskiy, D.
Simard, J.-M.
Caillat, T.
Masut, R. A.
Turenne, S.
Text and Data Mining valid from 2015-10-15