Reliability and Lifetime Prediction of Remote Phosphor Plates in Solid-State Lighting Applications Using Accelerated Degradation Testing
Crossref DOI link: https://doi.org/10.1007/s11664-015-4120-y
Published Online: 2015-11-05
Published Print: 2016-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mehr, M. Yazdan
van Driel, W. D.
Zhang, G. Q.
License valid from 2015-11-05
