Document is current

Any future updates will be listed below

Formation of Ni Diffusion-Induced Surface Traps in GaN/Al x Ga1−x N/GaN Heterostructures on Silicon Substrate During Gate Metal Deposition

Crossref DOI link: https://doi.org/10.1007/s11664-015-4135-4

Published Online: 2015-10-19

Published Print: 2016-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

About CrossMark