Crossmark

Effect of Percolation on Structural and Electrical Properties of MIC Processed SiGe/Al Multilayers

Crossref DOI link: https://doi.org/10.1007/s11664-015-4190-x

Published Online: 2015-11-09

Published Print: 2016-03

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Lindorf, M.

Rohrmann, H.

Span, G.

Albrecht, M.
Funding

Funding for this research was provided by:

Deutsche Forschungsgemeinschaft (SPP 1386)

European Research Council (FP7-263306)
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Text and Data Mining valid from 2015-11-09