Crossmark

Electromechanical Breakdown of Barrier-Type Anodized Aluminum Oxide Thin Films Under High Electric Field Conditions

Crossref DOI link: https://doi.org/10.1007/s11664-015-4195-5

Published Online: 2015-12-14

Published Print: 2016-02

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Chen, Jianwen

Yao, Manwen

Yao, Xi
Funding

Funding for this research was provided by:

Ministry of Science and Technology of China through 973-Project (2015CB654601)

International Science & Technology Cooperation Program of China (2013DFR50470)

National Science Foundation of China (51272177)
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