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Electrical Properties of PVP–SiO2–TMSPM Hybrid Thin Films as OFET Gate Dielectric

Crossref DOI link: https://doi.org/10.1007/s11664-015-4262-y

Published Online: 2015-12-08

Published Print: 2016-02

Update policy: https://doi.org/10.1007/springer_crossmark_policy