Optical Characterization of Si-Based Ge1−x Sn x Alloys with Sn Compositions up to 12%
Crossref DOI link: https://doi.org/10.1007/s11664-015-4283-6
Published Online: 2015-12-29
Published Print: 2016-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Al-Kabi, Sattar
Ghetmiri, Seyed Amir
Margetis, Joe
Du, Wei
Mosleh, Aboozar
Alher, Murtadha
Dou, Wei
Grant, Joshua M.
Sun, Greg
Soref, Richard A.
Tolle, John
Li, Baohua
Mortazavi, Mansour
Naseem, Hameed A.
Yu, Shui-Qing
Text and Data Mining valid from 2015-12-29