Electronic Transport of an Ni/n-GaAs Diode Analysed Over a Wide Temperature Range
Crossref DOI link: https://doi.org/10.1007/s11664-016-4342-7
Published Online: 2016-02-02
Published Print: 2016-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Guzel, A.
Duman, S.
Yildirim, N.
Turut, A.
Text and Data Mining valid from 2016-02-02
