Compact Test Structure to Measure All Thermophysical Properties for the In-Plane Figure of Merit ZT of Thin Films
Crossref DOI link: https://doi.org/10.1007/s11664-016-4405-9
Published Online: 2016-03-07
Published Print: 2016-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Moser, Dominik
Mueller, David
Paul, Oliver
Text and Data Mining valid from 2016-03-07
