Nondestructive Characterization of Residual Threading Dislocation Density in HgCdTe Layers Grown on CdZnTe by Liquid-Phase Epitaxy
Crossref DOI link: https://doi.org/10.1007/s11664-016-4522-5
Published Online: 2016-05-03
Published Print: 2016-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Fourreau, Y.
Pantzas, K.
Patriarche, G.
Destefanis, V.
Text and Data Mining valid from 2016-05-03