Detailed Analysis of Device Parameters by Means of Different Techniques in Schottky Devices
Crossref DOI link: https://doi.org/10.1007/s11664-016-4580-8
Published Online: 2016-05-19
Published Print: 2016-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Tuğluoğlu, Nihat
Koralay, Haluk
Akgül, Kübra Bengin
Çavdar, Şükrü
Funding for this research was provided by:
BAP Office of Gazi University (05/2013-06)
Text and Data Mining valid from 2016-05-19