Temperature-Dependent Electrical Properties and Carrier Transport Mechanisms of TMAH-Treated Ni/Au/Al2O3/GaN MIS Diode
Crossref DOI link: https://doi.org/10.1007/s11664-016-4809-6
Published Online: 2016-08-02
Published Print: 2016-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Reddy, M. Siva Pratap
Puneetha, Peddathimula
Reddy, V. Rajagopal
Lee, Jung-Hee
Jeong, Seong-Hoon
Park, Chinho
License valid from 2016-08-02