Microstructural Characterization and Electrical Properties of Ti–GaSb Junctions
Crossref DOI link: https://doi.org/10.1007/s11664-016-4840-7
Published Online: 2016-08-12
Published Print: 2016-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lin, Kun-Lin
Chen, Szu-Hung
License valid from 2016-08-12
