Effect of Remote Oxygen Scavenging on Electrical Properties of Ge-Based Metal–Oxide–Semiconductor Capacitors
Crossref DOI link: https://doi.org/10.1007/s11664-016-4841-6
Published Online: 2016-08-19
Published Print: 2017-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Fadida, Sivan http://orcid.org/0000-0001-9561-1426
Nyns, Laura
Van Elshocht, Sven
Eizenberg, Moshe
License valid from 2016-08-19