Stability of Indium Gallium Zinc Aluminum Oxide Thin-Film Transistors with Treatment Processes
Crossref DOI link: https://doi.org/10.1007/s11664-016-4851-4
Published Online: 2016-10-21
Published Print: 2017-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lin, Yung-Hao
Lee, Ching-Ting
Funding for this research was provided by:
Ministry of Science and Technology, Taiwan (MOST 105-2221-E-006-199-MY3)
License valid from 2016-10-21