Impact of an Elevated Temperature Environment on Sn-Ag-Cu Interconnect Board Level High-G Mechanical Shock Performance
Crossref DOI link: https://doi.org/10.1007/s11664-016-4902-x
Published Online: 2016-09-06
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lee, Tae-Kyu https://orcid.org/0000-0002-3433-8152
Chen, Zhiqiang
Baty, Greg
Bieler, Thomas R.
Kim, Choong-Un
License valid from 2016-09-06