Electromigration Behaviors of Cu Reinforced Sn-3.5Ag Composite Solder Joints
Crossref DOI link: https://doi.org/10.1007/s11664-016-4929-z
Published Online: 2016-09-15
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wang, Yan
Han, Jing
Ma, Limin
Zuo, Yong
Guo, Fu
Funding for this research was provided by:
National Natural Science Foundation of China (51401006, 51301007)
Beijing Natural Science Foundation (2162005)
Beijing Nova program (xx2016118)
License valid from 2016-09-15