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Analog/RF Study of Self-aligned In0.53Ga0.47As MOSFET with Scaled Gate Length

Crossref DOI link: https://doi.org/10.1007/s11664-016-4964-9

Published Online: 2016-10-03

Published Print: 2017-02

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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