Probing Phase Transformations and Microstructural Evolutions at the Small Scales: Synchrotron X-ray Microdiffraction for Advanced Applications in 3D IC (Integrated Circuits) and Solar PV (Photovoltaic) Devices
Crossref DOI link: https://doi.org/10.1007/s11664-016-5012-5
Published Online: 2016-10-21
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Radchenko, I.
Tippabhotla, S. K.
Tamura, N.
Budiman, A. S.
Funding for this research was provided by:
National Research Foundation Singapore (NRF2013EWT - EIRP002-017)
SUTD-MIT International Design Center (IDC) (IDG31400102)
License valid from 2016-10-21