Length-Dependent Electromigration Behavior of Sn58Bi Solder and Critical Length of Electromigration
Crossref DOI link: https://doi.org/10.1007/s11664-016-5093-1
Published Online: 2016-11-11
Published Print: 2017-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhao, Xu
Muraoka, Mikio
Saka, Masumi
License valid from 2016-11-11