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Influence of Thermal Annealing Treatment on Bipolar Switching Properties of Vanadium Oxide Thin-Film Resistance Random-Access Memory Devices

Crossref DOI link: https://doi.org/10.1007/s11664-016-5148-3

Published Online: 2016-12-01

Published Print: 2017-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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