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Thermal Conductivity Measurement of Thermoelectric Thin Films by a Versatility-Enhanced 2ω Method

Crossref DOI link: https://doi.org/10.1007/s11664-016-5170-5

Published Online: 2016-12-02

Published Print: 2017-05

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Okuhata, Ryo

Watanabe, Kentaro

Ikeuchi, Satoaki

Ishida, Akihiro

Nakamura, Yoshiaki
Funding

Funding for this research was provided by:

Grant-in-Aid for Scientific Research A (16H02078)

Grant-in-Aid for Exploratory Research (15K13276)

TEPCO Memorial Foundation (Research Grant (Basic Research))
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License valid from 2016-12-02