In Situ Oxidation of GaN Layer and Its Effect on Structural Properties of Ga2O3 Films Grown by Plasma-Assisted Molecular Beam Epitaxy
Crossref DOI link: https://doi.org/10.1007/s11664-017-5286-2
Published Online: 2017-01-18
Published Print: 2017-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ngo, Trong Si
Le, Duc Duy
Tran, Duy Khanh
Song, Jung-Hoon
Hong, Soon-Ku
Funding for this research was provided by:
Chungnam National University (2015-1799-01)
National Research Foundation of Korea (KR) (2013R1A1A2061251)
License valid from 2017-01-18