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Thickness Dependent Structural and Dielectric Properties of Calcium Copper Titanate Thin Films Produced by Spin-Coating Method for Microelectronic Devices

Crossref DOI link: https://doi.org/10.1007/s11664-017-5430-z

Published Online: 2017-03-20

Published Print: 2017-07

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Thiruramanathan, P.

Sankar, S.

Marikani, A.

Madhavan, D.

Sharma, Sanjeev K.
Funding

Funding for this research was provided by:

Defence Research and Development Organisation (ERIP/ER/1104613/M/01/1460)
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