Microwave Resistivity of Thermally Oxidized High Resistivity Silicon Wafers
Crossref DOI link: https://doi.org/10.1007/s11664-017-5636-0
Published Online: 2017-06-20
Published Print: 2017-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Judek, Jarosław
Zdrojek, Mariusz
Szmigiel, Dariusz
Krupka, Jerzy
Funding for this research was provided by:
The National Centre for Research and Development (Graf-Tech/NCBR /13/20/2013)
License valid from 2017-06-20