Influence of In Doping on the Electronic Transport Properties of n-Type Cu0.008Bi2Te2.7Se0.3
Crossref DOI link: https://doi.org/10.1007/s11664-018-06896-8
Published Online: 2019-01-07
Published Print: 2019-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yoo, Joonyeon
Kim, Ji-il
Choo, Sung-sil
Cho, Hyun-jun
Kim, Sang-il
Funding for this research was provided by:
Samsung (SRFC-MA1701-05)
Text and Data Mining valid from 2019-01-07
Article History
Received: 18 August 2018
Accepted: 18 December 2018
First Online: 7 January 2019