Modeling and Evaluation of Stacking Fault Expansion Velocity in Body Diodes of 3.3 kV SiC MOSFET
Crossref DOI link: https://doi.org/10.1007/s11664-018-06901-0
Published Online: 2019-01-11
Published Print: 2019-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Konishi, Kumiko http://orcid.org/0000-0002-9737-2948
Fujita, Ryusei
Shima, Akio
Text and Data Mining valid from 2019-01-11
Article History
Received: 10 April 2018
Accepted: 20 December 2018
First Online: 11 January 2019