Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices
Crossref DOI link: https://doi.org/10.1007/s11664-018-6144-6
Published Online: 2018-02-26
Published Print: 2018-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Tomm, Jens W.
Kernke, Robert
Mura, Giovanna
Vanzi, Massimo
Hempel, Martin
Acklin, Bruno
Text and Data Mining valid from 2018-02-26
Article History
Received: 8 November 2017
Accepted: 13 February 2018
First Online: 26 February 2018