Strain Analysis of CdTe on InSb Epitaxial Structures Using X-ray-Based Reciprocal Space Measurements and Dynamical Diffraction Simulations
Crossref DOI link: https://doi.org/10.1007/s11664-018-6566-1
Published Online: 2018-08-10
Published Print: 2018-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Liao, Michael
Campbell, Calli
Tsai, Cheng-Ying
Zhang, Yong-Hang
Goorsky, Mark
Text and Data Mining valid from 2018-08-10
Article History
Received: 14 March 2018
Accepted: 31 July 2018
First Online: 10 August 2018