Temperature and Interfacial Layer Effects on the Electrical and Dielectric Properties of Al/(CdS-PVA)/p-Si (MPS) Structures
Crossref DOI link: https://doi.org/10.1007/s11664-018-6578-x
Published Online: 2018-08-13
Published Print: 2018-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ersöz Demir, Gülçin
Yücedağ, İbrahim http://orcid.org/0000-0003-2975-7392
Azizian-Kalandaragh, Yashar
Altındal, Şemsettin
Text and Data Mining valid from 2018-08-13
Article History
Received: 22 April 2018
Accepted: 3 August 2018
First Online: 13 August 2018