Electrical Properties of Indium Aluminum Zinc Oxide Thin Film Transistors
Crossref DOI link: https://doi.org/10.1007/s11664-018-6618-6
Published Online: 2018-08-31
Published Print: 2018-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Cheng, Tien-Hung
Chang, Sheng-Po https://orcid.org/0000-0002-4126-0576
Chang, Shoou-Jinn
Funding for this research was provided by:
Ministry of Science and Technology, Taiwan (105-2221-E-006-118, 106-2221-E-006-178)
Text and Data Mining valid from 2018-08-31
Article History
Received: 14 March 2018
Accepted: 18 August 2018
First Online: 31 August 2018