Corrosion-Induced Mass Loss of Cu9Al4 at the Cu-Al Ball–Bond Interface: Explained Based on Full Immersion of Cu, Al, and Cu-Al Intermetallic Galvanic Couples
Crossref DOI link: https://doi.org/10.1007/s11664-018-6625-7
Published Online: 2018-09-10
Published Print: 2019-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wu, Yuelin
Lee, Andre https://orcid.org/0000-0001-6921-7214
Funding for this research was provided by:
Semiconductor Research Corporation (2012-KJ-2285)
Text and Data Mining valid from 2018-09-10
Article History
Received: 19 April 2018
Accepted: 25 August 2018
First Online: 10 September 2018