Microstructural Characterization of Defects and Chemical Etching for HgCdSe/ZnTe/Si (211) Heterostructures
Crossref DOI link: https://doi.org/10.1007/s11664-018-6737-0
Published Online: 2018-10-30
Published Print: 2019-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Vaghayenegar, M.
Doyle, K. J.
Trivedi, S.
Wijewarnasuriya, P.
Smith, David J.
Funding for this research was provided by:
Army Research Office (63749-EL)
Text and Data Mining valid from 2018-10-30
Version of Record valid from 2018-10-30
Article History
Received: 23 May 2018
Accepted: 11 October 2018
First Online: 30 October 2018