Electrical Characterization of ZnInSe2/Cu0.5Ag0.5InSe2 Thin-Film Heterojunction
Crossref DOI link: https://doi.org/10.1007/s11664-019-07070-4
Published Online: 2019-02-25
Published Print: 2019-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gullu, H. H. http://orcid.org/0000-0001-8541-5309
Parlak, M.
Text and Data Mining valid from 2019-02-25
Article History
Received: 29 August 2018
Accepted: 13 February 2019
First Online: 25 February 2019