Studies on Lattice Strain Variation due to Nitrogen Doping by Synchrotron X-ray Contour Mapping Technique in PVT-Grown 4H-SiC Crystals
Crossref DOI link: https://doi.org/10.1007/s11664-019-07077-x
Published Online: 2019-02-26
Published Print: 2019-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ailihumaer, Tuerxun http://orcid.org/0000-0002-3575-8618
Yang, Yu
Guo, Jianqiu
Raghothamachar, Balaji
Dudley, Michael
Text and Data Mining valid from 2019-02-26
Article History
Received: 1 October 2018
Accepted: 15 February 2019
First Online: 26 February 2019