Improved Structural and Electrical Properties of ZnO-Based Thin Film Transistors by Using Pulsed KrF Excimer Laser Irradiation
Crossref DOI link: https://doi.org/10.1007/s11664-019-07080-2
Published Online: 2019-02-26
Published Print: 2019-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Oh, Min-Suk
Nirmala, R.
Navamathavan, R.
Text and Data Mining valid from 2019-02-26
Article History
Received: 12 June 2018
Accepted: 15 February 2019
First Online: 26 February 2019