Structural, Chemical and Electrical Properties of Au/La2O3/n-GaN MIS Junction with a High-k Lanthanum Oxide Insulating Layer
Crossref DOI link:
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sekhar Reddy, P. R.
Rajagopal Reddy, V.
Text and Data Mining valid from 2019-04-10
23 November 2018
3 April 2019
10 April 2019