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Full-Wafer Strain and Relaxation Mapping of Hg1−xCdxTe Multilayer Structures Grown on Cd1−yZnyTe Substrates

Crossref DOI link: https://doi.org/10.1007/s11664-019-07289-1

Published Online: 2019-05-23

Published Print: 2019-10

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Shojaei, B. http://orcid.org/0000-0002-2782-6924
Cottier, R.

Lee, D.

Piquette, E.

Carmody, M.

Zandian, M.

Yulius, A.
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Text and Data Mining valid from 2019-05-23

Version of Record valid from 2019-05-23
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Article History

Received: 30 November 2018

Accepted: 14 May 2019

First Online: 23 May 2019