Junction Parameters and Electrical Characterization of the Al/n-Si/Cu2CoSnS4/Au Heterojunction
Crossref DOI link: https://doi.org/10.1007/s11664-019-07445-7
Published Online: 2019-07-22
Published Print: 2019-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
El Radaf, I. M. http://orcid.org/0000-0001-6197-5272
Elsaeedy, H. I.
Yakout, H. A.
El Sayed, Mardia T.
Text and Data Mining valid from 2019-07-22
Version of Record valid from 2019-07-22
Article History
Received: 20 March 2019
Accepted: 9 July 2019
First Online: 22 July 2019