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Metalorganic Vapor Phase Epitaxy of Thick and Uniform Single Crystal CdTe Epitaxial Layers on (211) Si Substrates for X-ray Imaging Detector Development

Crossref DOI link: https://doi.org/10.1007/s11664-019-07601-z

Published Online: 2019-09-05

Published Print: 2019-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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