Negative Differential Resistance (NDR) Behavior of Nickel Oxide (NiO) Based Metal-Insulator-Semiconductor Structures
Crossref DOI link: https://doi.org/10.1007/s11664-019-07781-8
Published Online: 2019-11-18
Published Print: 2020-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Khan, Kamruzzaman http://orcid.org/0000-0001-7631-7977
Itapu, Srikanth
Georgiev, Daniel G.
Text and Data Mining valid from 2019-11-18
Version of Record valid from 2019-11-18
Article History
Received: 10 January 2019
Accepted: 29 October 2019
First Online: 18 November 2019