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Analytical Modeling of ZrO2, HfO2 and SiO2 Effect over Tunneling Field Effect Transistor

Crossref DOI link: https://doi.org/10.1007/s11664-019-07789-0

Published Online: 2019-11-27

Published Print: 2020-02

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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