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Recent Research Trends in Point Defects in Copper Iodide Semiconductors

Crossref DOI link: https://doi.org/10.1007/s11664-019-07833-z

Published Online: 2019-11-27

Published Print: 2020-02

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Koyasu, Satoshi

Miyauchi, Masahiro
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Text and Data Mining valid from 2019-11-27

Version of Record valid from 2019-11-27
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Article History

Received: 5 August 2019

Accepted: 12 November 2019

First Online: 27 November 2019