Annealing Temperature Dependence of ZTO Thin Film Properties and Its Application on Thin Film Transistors by Inkjet Printing
Crossref DOI link: https://doi.org/10.1007/s11664-019-07871-7
Published Online: 2019-12-10
Published Print: 2020-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ryu, Sang Ouk
Ha, Cheul Ho
Jun, Ho Young
Ryu, Si Ok https://orcid.org/0000-0002-1150-1797
Funding for this research was provided by:
Yeungnam University Research Grant (216A380108)
Ministry of Trade, Industry and Energy (20174030201760)
Text and Data Mining valid from 2019-12-10
Version of Record valid from 2019-12-10
Article History
Received: 17 September 2019
Accepted: 2 December 2019
First Online: 10 December 2019