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Numerical Simulation of Enhanced-Reliability Filleted-Gate AlGaN/GaN HEMT

Crossref DOI link: https://doi.org/10.1007/s11664-019-07905-0

Published Online: 2020-01-03

Published Print: 2020-03

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Ray, Ashok https://orcid.org/0000-0003-2474-3207
Bordoloi, Sushanta https://orcid.org/0000-0002-5179-0861
Sarkar, Biplab

Agarwal, Pratima

Trivedi, Gaurav
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Text and Data Mining valid from 2020-01-03

Version of Record valid from 2020-01-03
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Article History

Received: 18 June 2019

Accepted: 13 December 2019

First Online: 3 January 2020