A Model for Intermetallic Growth in Thin Sn Joints Between Cu Substrates: Application to Solder Microjoints
Crossref DOI link: https://doi.org/10.1007/s11664-020-08019-8
Published Online: 2020-02-27
Published Print: 2020-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Arafat, Y.
Yang, H.
Dutta, I.
Kumar, P. A.
Datta, B.
Funding for this research was provided by:
Missile Defense Agency
Text and Data Mining valid from 2020-02-27
Version of Record valid from 2020-02-27
Article History
Received: 14 October 2019
Accepted: 12 February 2020
First Online: 27 February 2020