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Relative Study of Analog Performance, Linearity, and Harmonic Distortion Between Junctionless and Conventional SOI FinFETs at Elevated Temperatures

Crossref DOI link: https://doi.org/10.1007/s11664-020-08024-x

Published Online: 2020-02-26

Published Print: 2020-05

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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