Triangular Single Shockley Stacking Fault Analyses on 4H-SiC PiN Diode with Forward Voltage Degradation
Crossref DOI link: https://doi.org/10.1007/s11664-020-08133-7
Published Online: 2020-04-13
Published Print: 2020-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Nishio, Johji
Okada, Aoi
Ota, Chiharu
Kushibe, Mitsuhiro
Text and Data Mining valid from 2020-04-13
Version of Record valid from 2020-04-13
Article History
Received: 14 November 2019
Accepted: 31 March 2020
First Online: 13 April 2020