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Linearity and Reliability Analysis of an Electrically Doped Hetero Material Nanowire TFET

Crossref DOI link: https://doi.org/10.1007/s11664-020-08143-5

Published Online: 2020-04-26

Published Print: 2020-07

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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